@INPROCEEDINGS{BarenghiHBSRK-2011-rfidsec,
   author        = {Barenghi, Alessandro and Hocquet, C\'edric and Bol, David and Standaert, Fran\c{c}ois-Xavier and Regazzoni, Francesco and Koren, Israel},
   title         = {{Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-Threshold Devices through an example of a 65nm AES implementation}},
    booktitle     = {Workshop on RFID Security -- RFIDSec'11},
    year          = {2011},
    editor        = {},
    volume        = {},
    series        = {},
    pages         = {},
    address       = {Amherst, Massachusetts, USA},
    month         = {June},
    organization  = {},
    publisher     = {},
    pdf           = {http://rfid-cusp.org/rfidsec/files/RFIDSec2011DraftPapers/BarenghiEtAl.pdf},
    slides        = {},
   bibsource     = {Information Security Group (GSI), UCL, Louvain-la-Neuve, Belgium},
}